Anatune and Syft Technologies exhibit at BMSS 2015
Posted on October 7th, 2015
On the 15th-17th September, Anatune joined Syft Technologies and exhibited at the 36th BMSS Annual Meeting at the University of Birmingham.
In addition to Anatune’s exhibition stand, Vaughan Langford, Syft Technologies Applications Manager, also presented 2 posters showcasing some of the latest application developments in SIFT-MS. They demonstrated the broad applicability of SIFT-MS for simple, rapid, high-sensitivity VOC and semi-VOC analysis.
These were well-received by the delegates and you can download a copy of the posters here:
- Real-Time Analysis of United States EPA Method TO-14A Compounds using SIFT-MS
- Extending SIFT-MS to Detection of Semi-Volatiles on Surfaces
If you wish to discuss SIFT-MS in more detail, please contact us now on 01223 279210, or email firstname.lastname@example.org.